Walter Scott, Jr. College of Engineering

Graduate Exam Abstract

Fernando Brizuela
Ph.D. Qualifying
Aug 08, 2007, 2:00 pm
Abstract: This is a qualifying exam
Adviser: Carmen Menoni
Co-Adviser: Jorge Rocca
Non-ECE Member: Stephen R. Lundeen
Member 3: David Attwood
Addional Members:
Brizuela, F., et al., Anodically grown films on copper and copper-nickel alloys in slightly alkaline solutions. Journal of Applied Electrochemistry, 2006. 36(5): p. 583-590. Brizuela, F., et al., Reflection mode imaging with nanoscale resolution using a compact extreme ultraviolet laser. Optics Express, 2005. 13(11): p. 3983-3988. Kohli, S., et al., X-ray characterization of oriented beta-tantalum films. Thin Solid Films, 2004. 469-70: p. 404-409. Larotonda, M.A., et al., Characteristics of a saturated 18.9-nm tabletop laser operating at 5-Hz repetition rate. IEEE Journalof Selected Topics in Quantum Electronics, 2004. 10(6): p. 1363-1367. Vaschenko, G., et al., Sub-38 nm resolution tabletop microscopy with 13 nm wavelength laser light. Optics Letters, 2006. 31(9): p. 1214-1216. Vaschenko, G., et al., Nanoimaging with a compact extreme-ultraviolet laser. Optics Letters, 2005. 30(16): p. 2095-2097. Wang, Y., et al., Capillary discharge-driven metal vapor plasma waveguides. Physical Revi

Publications to be Reviewed:

Program of Study: