Selected Publications

For the full list of publications, please refer to Google Scholar.

2024

U. Surendranathan, H. Wilson, L. R. Cao, A. Milenkovic, and B. Ray

Analysis of SRAM PUF integrity under ionizing radiation: Effects of stored data and technology node

IEEE Transactions on Nuclear Science, vol. 71, no. 4, pp. 485-491, 2024.

Link | Video

M. A. Kumar, and B. Ray

Cross-Temperature Reliability of 3D NAND: Cell-to-Cell Variability Analysis and Countermeasure

Proc. of the 2024 IEEE International Reliability Physics Symposium (IRPS), Dallas, TX, April 2024.

LinkVideo

M. Buddhanoy, K. Khan, A. Milenkovic, S. Pasricha and B. Ray

Improving Block Management in 3D NAND Flash SSDs with Sub-Block First Write Sequencing

Proc. of the 2024 IEEE Great Lakes Symposium on VLSI, 2024.

Link | Video

2023

Md Raquibuzzaman, A. Milenkovic, and B. Ray

Hide-and-Seek: Hiding Secrets in Threshold Voltage Distributions of NAND Flash Memory Cells

Proc. of the 15th ACM Workshop on Hot Topics in Storage and File Systems (HotStorage), July 2023, pages 80–86.

Link I Slides

Md Raquibuzzaman, A. Milenkovic, and B. Ray

Intrablock Wear Leveling to Counter Layer-to-Layer Endurance Variation
of 3-D NAND Flash Memory

IEEE Transactions on Electron Devices, vol. 70, no. 1, pp. 70-75, 2023.

Link | Video

M. Buddhanoy, and B. Ray

Electrostatic Shielding of NAND Flash Memory from Ionizing Radiation

Proc. of the 2023 IEEE International Reliability Physics Symposium (IRPS), 2023.

Link | PDF | Video

2022

Md Raquibuzzaman, M. Buddhanoy, A. Milenkovic, and B. Ray

Instant Data Sanitization on Multi-Level-Cell NAND Flash Memory

Proceedings of the 15th ACM International Conference on Systems and Storage (SYSTOR ’22).

Link  |   Video

P. Kumari, U. Surendranathan, M. Wasiolek, K. Hattar, N.P. Bhat and B. Ray

Analytical Bit-Error Model of NAND Flash Memories for Dosimetry Application

IEEE Transactions on Nuclear Science, vol. 69, no. 3, pp. 478-484, 2022.

Link    |    PDF     |     Video

2021

S. Sakib, A. Milenkovic, and B. Ray

Flash-DNA: Identifying NAND Flash Memory Origins Using Intrinsic Array Properties

IEEE Transactions on Electron Devices, vol. 68, no. 8, pp. 3794-3800, 2021.

Link    |    PDF     |     Video

P. Kumari, U. Surendranathan, M. Wasiolek, K. Hattar, N.P. Bhat and B. Ray

Radiation Induced Error Mitigation by Read-Retry Technique for MLC 3-D NAND Flash Memory

IEEE Transactions on Nuclear Science, vol. 68, no. 5, pp. 733-739, 2021.

Link    |    PDF     |     Video

2020

M. Hasan and B. Ray

Data Recovery from “Scrubbed” NAND Flash Storage: Need for Analog Sanitization

Proc. of the 29th USENIX Security Symposium, Boston, MA, Aug. 2020.

Link    |    Video   

S. Sakib, A. Milenkovic, and B. Ray

Flash Watermark: An Anti-Counterfeiting Technique for NAND Flash Memories

IEEE Transaction on Electron Devices, vol. 67, no. 10, pp. 4172–4177, 2020.

Link    |    PDF     

S. Sakib, A. Milenkovic, M. T. Rahman, and B. Ray

An Aging-Resistant NAND Flash Memory Physical Unclonable Function

IEEE Transaction on Electron Devices, vol. 27, no. 3, pp. 937–943, Mar. 2020.

Link    |    PDF     

M. Hasan and B. Ray

Reliability of NAND Flash Memory as a Weight Storage Device of Artificial Neural Network

IEEE Transactions on Device and Materials Reliability, vol. 20, no. 3, pp. 596-603, 2020.

 

Link    |    PDF     |     Video

2019

P. Poudel, B. Ray, and A. Milinkovic

Microcontroller TRNGs Using Perturbed States of NOR Flash Memory Cells

IEEE Transaction on Computer, vol. 68, no. 2, pp. 307–313, 2019.

Link    |     Video

B. Talukder, B. Ray, D. Forte, and M. T. Rahman

PreLatPUF: Exploiting DRAM Latency Variations for Generating Robust Device Signatures

IEEE Access, vol. 7, no. 1, pp. 81106-81120, 2019  

Link   |     Video

2018

S. Sakib, P. Kumari, B.M.S.B. Talukder, M.T. Rahman, and B. Ray

Non-Invasive Detection Method for Recycled Flash Memory Using Timing Characteristics

MDPI Cryptography, vol. 2, no. 3, pp. 17, Aug. 2018. (This work was highlighted in IEEE Spectrum)

Link    |    PDF      

B. Ray, and A. Milenkovic

True Random Number Generation Using Read Noise of Flash Memory Cells

IEEE Transaction on Electron Devices, vol. 65, no. 2, pp. 963-969, 2018.

Link    |    PDF    

P. Kumari, L. Davies, N. P. Bhat, E. X. Zhang, M. W. McCurdy, D. M. Fleetwood and B. Ray

State-of-the-Art Flash Chips for Dosimetry Application

Proc. of the IEEE Radiation Effects Data Workshop (REDW), 2018.

Link    |    PDF