{"id":80,"date":"2021-03-04T20:14:14","date_gmt":"2021-03-04T20:14:14","guid":{"rendered":"https:\/\/www.engr.colostate.edu\/laboratories\/adaptive-robotics-laboratory\/?page_id=80"},"modified":"2024-05-22T02:44:01","modified_gmt":"2024-05-22T02:44:01","slug":"publications","status":"publish","type":"page","link":"https:\/\/www.engr.colostate.edu\/laboratories\/ramlab\/publications\/","title":{"rendered":"Publications"},"content":{"rendered":"\t\t
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Selected Publications<\/h1>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t
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For the full list of publications, please refer to Google Scholar.<\/span><\/a><\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t

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2024<\/h2>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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\"\"<\/p>

U. Surendranathan, H. Wilson, L. R. Cao, A. Milenkovic, and B. Ray<\/p>

Analysis of SRAM PUF integrity under ionizing radiation: Effects of stored data and technology node<\/strong><\/p>

IEEE Transactions on Nuclear Science, vol. 71, no. 4, pp. 485-491, 2024.<\/p>

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\"\"<\/p>

M. A. Kumar, and B. Ray<\/p>

Cross-Temperature Reliability of 3D NAND: Cell-to-Cell Variability Analysis and Countermeasure<\/strong><\/p>

Proc. of the 2024 IEEE International Reliability Physics Symposium (IRPS<\/em><\/strong>), Dallas, TX, April 2024.<\/p>

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M. Buddhanoy, K. Khan, A. Milenkovic, S. Pasricha and B. Ray<\/p>

Improving Block Management in 3D NAND Flash SSDs with Sub-Block First Write Sequencing<\/strong><\/p>

Proc. of the 2024 IEEE Great Lakes Symposium on VLSI, 2024.<\/p>

Link<\/a> | Video<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t

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2023<\/h2>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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\"\"<\/p>

Md Raquibuzzaman, A. Milenkovic, and B. Ray<\/p>

Hide-and-Seek: Hiding Secrets in Threshold Voltage Distributions of NAND Flash Memory Cells<\/strong><\/p>

Proc. of the 15th ACM Workshop on Hot Topics in Storage and File Systems (HotStorage)<\/strong>, July 2023, pages 80\u201386.<\/p>

Link<\/a>\u00a0I Slides<\/a><\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t

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\"\"<\/p>

Md Raquibuzzaman, A. Milenkovic, and B. Ray<\/p>

Intrablock Wear Leveling to Counter Layer-to-Layer Endurance Variation<\/strong>
of 3-D NAND Flash Memory<\/strong><\/p>

IEEE Transactions on Electron Devices, vol. 70, no. 1, pp. 70-75, 2023.<\/p>

Link<\/a> | Video<\/a><\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t

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\"\"<\/p>

M. Buddhanoy, and B. Ray<\/p>

Electrostatic Shielding of NAND Flash Memory from Ionizing Radiation<\/strong><\/p>

Proc. of the 2023 IEEE International Reliability Physics Symposium (IRPS<\/em><\/strong>), 2023.<\/p>

Link<\/a> | PDF | Video<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t

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2022<\/h2>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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\"\"<\/p>

Md Raquibuzzaman, M. Buddhanoy, A. Milenkovic, and B. Ray<\/p>

Instant Data Sanitization on Multi-Level-Cell NAND Flash Memory<\/strong><\/p>

Proceedings of the 15th ACM International Conference on Systems and Storage (SYSTOR \u201922<\/strong>)<\/em>.<\/p>

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\"\"P. Kumari, U. Surendranathan, M. Wasiolek, K. Hattar, N.P. Bhat and B. Ray<\/p>

Analytical Bit-Error Model of NAND Flash Memories for Dosimetry Application<\/strong><\/p>

IEEE Transactions on Nuclear Science, vol. 69, no. 3, pp. 478-484, 2022.<\/p>

Link\u00a0<\/a> \u00a0 |\u00a0 \u00a0 PDF\u00a0 \u00a0 \u00a0|\u00a0 \u00a0 \u00a0Video<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t

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2021<\/h2>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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\"\"S. Sakib, A. Milenkovic, and B. Ray<\/p>

Flash-DNA: Identifying NAND Flash Memory Origins Using Intrinsic Array Properties<\/strong><\/p>

IEEE Transactions on Electron Devices, vol. 68, no. 8, pp. 3794-3800, 2021.<\/p>

Link\u00a0 \u00a0 |\u00a0 \u00a0 PDF\u00a0 \u00a0 \u00a0|\u00a0 \u00a0 \u00a0Video<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t

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\"\"<\/p>

P. Kumari, U. Surendranathan, M. Wasiolek, K. Hattar, N.P. Bhat and B. Ray<\/p>

Radiation Induced Error Mitigation by Read-Retry Technique for MLC 3-D NAND Flash Memory<\/strong><\/p>

IEEE Transactions on Nuclear Science, vol. 68, no. 5, pp. 733-739, 2021.<\/p>

Link\u00a0 \u00a0 |\u00a0 \u00a0 PDF\u00a0 \u00a0 \u00a0|\u00a0 \u00a0 \u00a0Video<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t

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2020<\/h2>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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\"\"M. Hasan and B. Ray<\/p>

Data Recovery from \u201cScrubbed\u201d NAND Flash Storage: Need for Analog Sanitization<\/strong><\/p>

Proc. of the 29th USENIX Security Symposium<\/em><\/strong>, Boston, MA, Aug. 2020.<\/p>

Link<\/a>\u00a0 \u00a0 |\u00a0 \u00a0 Video\u00a0<\/a> \u00a0<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t

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\"\"S. Sakib, A. Milenkovic, and B. Ray<\/p>

Flash Watermark: An Anti-Counterfeiting Technique for NAND Flash Memories<\/strong><\/p>

IEEE Transaction on Electron Devices, vol. 67, no. 10, pp. 4172\u20134177, 2020.<\/p>

Link\u00a0 \u00a0 |\u00a0 \u00a0 PDF\u00a0 \u00a0 \u00a0<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t

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\"\"S. Sakib, A. Milenkovic, M. T. Rahman, and B. Ray<\/p>

An Aging-Resistant NAND Flash Memory Physical Unclonable Function<\/strong><\/p>

IEEE Transaction on Electron Devices, vol. 27, no. 3, pp. 937\u2013943, Mar. 2020.<\/p>

Link\u00a0 \u00a0 |\u00a0 \u00a0 PDF\u00a0 \u00a0 \u00a0<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t

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\"\"M. Hasan and B. Ray<\/p>

Reliability of NAND Flash Memory as a Weight Storage Device of Artificial Neural Network<\/p>

IEEE Transactions on Device and Materials Reliability, vol. 20, no. 3, pp. 596-603, 2020.<\/p>

\u00a0<\/p>

Link\u00a0 \u00a0 |\u00a0 \u00a0 PDF\u00a0 \u00a0 \u00a0|\u00a0 \u00a0 \u00a0Video<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t

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2019<\/h2>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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\"\"P. Poudel, B. Ray, and A. Milinkovic<\/p>

Microcontroller TRNGs Using Perturbed States of NOR Flash Memory Cells<\/p>

IEEE Transaction on Computer, vol. 68, no. 2, pp. 307\u2013313, 2019.<\/p>

Link\u00a0 \u00a0 |\u00a0 \u00a0 \u00a0Video<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t

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\"\"B. Talukder, B. Ray, D. Forte, and M. T. Rahman <\/p>

PreLatPUF: Exploiting DRAM Latency Variations for Generating Robust Device Signatures<\/p>

IEEE Access, vol. 7, no. 1, pp. 81106-81120, 2019 \u00a0<\/p>

Link\u00a0 \u00a0|\u00a0 \u00a0 \u00a0Video<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t

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2018<\/h2>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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\"\"<\/p>

S. Sakib, P. Kumari, B.M.S.B. Talukder, M.T. Rahman, and B. Ray<\/p>

Non-Invasive Detection Method for Recycled Flash Memory Using Timing Characteristics<\/p>

MDPI Cryptography, vol. 2, no. 3, pp. 17, Aug. 2018. (This work was highlighted in IEEE Spectrum<\/em><\/strong>)<\/span><\/p>

Link\u00a0 \u00a0 |\u00a0 \u00a0 PDF\u00a0 \u00a0\u00a0\u00a0\u00a0<\/span><\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t

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\"\"<\/p>

B. Ray, and A. Milenkovic<\/p>

True Random Number Generation Using Read Noise of Flash Memory Cells<\/p>

IEEE Transaction on Electron Devices, vol. 65, no. 2, pp. 963-969, 2018.<\/p>

Link\u00a0 \u00a0 |\u00a0 \u00a0 PDF\u00a0 \u00a0\u00a0<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t

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\"\"<\/p>

P. Kumari, L. Davies, N. P. Bhat, E. X. Zhang, M. W. McCurdy, D. M. Fleetwood and B. Ray<\/p>

State-of-the-Art Flash Chips for Dosimetry Application<\/p>

Proc. of the IEEE Radiation Effects Data Workshop (REDW<\/em><\/strong>), 2018.<\/p>

Link\u00a0 \u00a0 |\u00a0 \u00a0 PDF\u00a0 \u00a0\u00a0<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t<\/div>\n\t\t","protected":false},"excerpt":{"rendered":"

Selected Publications For the full list of publications, please refer to Google Scholar. 2024 U. Surendranathan, H. Wilson, L. R. Cao, A. Milenkovic, and B. Ray Analysis of SRAM PUF integrity under ionizing radiation: Effects of stored data and technology node IEEE Transactions on Nuclear Science, vol. 71, no. 4, pp. 485-491, 2024. Link |…Read more <\/a><\/p>\n","protected":false},"author":21,"featured_media":851,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"elementor_header_footer","meta":{"footnotes":""},"class_list":["post-80","page","type-page","status-publish","has-post-thumbnail","hentry"],"yoast_head":"\nPublications - Reliable and Assured Microelectronics (RAM) Laboratory<\/title>\n<meta name=\"description\" content=\"Publications related to the research of the fundamental science and applications for adaptive robots at Colorado State University.\" \/>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/www.engr.colostate.edu\/laboratories\/ramlab\/publications\/\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Publications - Reliable and Assured Microelectronics (RAM) Laboratory\" \/>\n<meta property=\"og:description\" content=\"Publications related to the research of the fundamental science and applications for adaptive robots at Colorado State University.\" \/>\n<meta property=\"og:url\" content=\"https:\/\/www.engr.colostate.edu\/laboratories\/ramlab\/publications\/\" \/>\n<meta property=\"og:site_name\" content=\"Reliable and Assured Microelectronics (RAM) Laboratory\" \/>\n<meta property=\"article:modified_time\" content=\"2024-05-22T02:44:01+00:00\" \/>\n<meta name=\"twitter:card\" content=\"summary_large_image\" \/>\n<meta name=\"twitter:label1\" content=\"Est. reading time\" \/>\n\t<meta name=\"twitter:data1\" content=\"7 minutes\" \/>\n<script type=\"application\/ld+json\" class=\"yoast-schema-graph\">{\"@context\":\"https:\\\/\\\/schema.org\",\"@graph\":[{\"@type\":\"WebPage\",\"@id\":\"https:\\\/\\\/www.engr.colostate.edu\\\/laboratories\\\/ramlab\\\/publications\\\/\",\"url\":\"https:\\\/\\\/www.engr.colostate.edu\\\/laboratories\\\/ramlab\\\/publications\\\/\",\"name\":\"Publications - 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