Graduate Exam Abstract
April 3, 2007, 2pm-4pm
Adviser: Dr. Tom W. Chen
Non-ECE Member: Dr. Ryan T. Elmore
Member 3: Dr. Steven C. Reising
Addional Members: N/A
Publications to be Reviewed:
J.Ray, J.C.Hoe, B.Falsafi, "Dual use of superscalar datapath for transient-fault detection and recovery", Proceedings of 34th ACM/IEEE International Symposium on microarchitecture. 2001.
K.J.McIver III and L.T.Clark, "Reducing Radiation-Hardened Digital Circuit Power Consumption", IEEE Trans. on Nuclear Science, Vol.52, No. 6, Dec. 2005.
Program of Study: